
Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability & robustness of integrated circuits & electronic systems This book summarizes the many diverse methodologies aimed at ESD protection & shows through a number of concrete studies that the best approach in terms of robustness & cost-effectiveness consists of implementing a global strategy of ESD protection ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization & defect localization methods aimed at implementing corrective measures Due to the increasing complexity of integrated circuits it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection while not harming the performance levels of the circuit Therefore the main features & difficulties related to the different types of simulation finite element SPICE-type & behavioral are then studied To conclude several case studies are presented which provide real-life examples of the approaches explained in the previous chapters & validate a number of the strategies from component to system level